Measurement Uncertainty of White-Light Interferometry on Optically Rough Surfaces

نویسنده

  • Pavel Pavlíček
چکیده

A Michelson interferometer is illuminated by a broadband light source (e.g. light-emitting diode, superluminescent diode, arc or incandescent lamp). At the output of the interferometer, a CCD camera is used as a multiple detector. The measured object is placed in one arm of the interferometer and moved in the longitudinal direction as indicated by the arrow in Fig. 1. The surface of the object is imaged by a telecentric optical system onto the lightsensitive area of the CCD camera. During the moving of the object in the longitudinal direction, a series of images is acquired. From the acquired series, the coherence function (also referred to as correlogram or interferogram) can be extracted for each object point. The maximum of the Measurement Uncertainty of White-Light Interferometry on Optically Rough Surfaces 22

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Single-shot profilometry of rough surfaces using hyperspectral interferometry.

The combination of white light interferometry with hyperspectral imaging ("hyperspectral interferometry") is a recently proposed technique for single-shot measurement of 3D surface profiles. We consider for the first time its application to speckled wavefronts from optically rough surfaces. The intensity versus wavenumber signal at each pixel provides unambiguous range information despite the s...

متن کامل

Hyperspectral interferometry for single-shot absolute measurement of two-dimensional optical path distributions

We propose a method that we call Hyperspectral Interferometry (HSI) to resolve the 2 phase unwrapping problem in the analysis of interferograms recorded with a narrow-band light source. By using a broad-band light source and hyperspectral imaging system, a set of interferograms at different wavenumbers are recorded simultaneously on a high resolution image sensor. These are then assembled to f...

متن کامل

Comparison of Fast Fourier Transform and Convolution in Wavelength Scanning Interferometry

The assessment of surface finish has become increasingly important in the field of precision engineering. Optical interferometry has been widely used for surface measurement due to the advantages of non-contact and high accuracy interrogation. In spite of the 2π phase ambiguity that can limit the measurement scale in monochromatic interferometry, other optical interferomtry have succeeded to ov...

متن کامل

Two-wavelength double heterodyne interferometry using a matched grating technique.

Two-wavelength double heterodyne interferometry is applied for topographic measurements on optically rough target surfaces. A two-wavelength He-Ne laser and a matched grating technique are used to improve system stability and to simplify heterodyne frequency generation.

متن کامل

In-process fast surface measurement using wavelength scanning interferometry

A wavelength scanning interferometry system for fast areal surface measurement of micro and nano-scale surfaces which is immune to environmental noise is introduced in this paper. It can be used for surface measurement of discontinuous surface profiles by producing phase shifts without any mechanical scanning process. White light spectral scanning interferometry, together with an acousto-optic ...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 2012